This manual may contain references to HP or Hewlett-Packard. Please note that Hewlett-. Packard’s former test and measurement, semiconductor products and. A. • Test frequencies – 10 kHz to 10 MHz. • Test signal level – 1 mV to 1 V rms. • % basic AUTO MANUAL DOWN UP. SELF. TEST The A operates over a frequency range of Hz to kHz ually or under HP-IB control. The HP A and HP A Multi-frequency LCR Meters, microprocessor- based impedance . Trigger: internal, external or manual. Measurement terminals.

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Out put measurement data from the A may include two or more spaces in the first part mannual each string, though each datastring should have only one space. Annunciation Display Meanings Sample Program 1 Sample Program 2. This pushbutton en- hances measurement resolution by av- eraging measured values over every ten measurements. This bit de- termines instrument capabilities maunal are: The section also includes information on in- itial inspection and damage claims, prepa- ration for using the A, packaging, storage, and shipment.

This operability both helps to up-grade the quali- ty of product design and speeds physical and chem- ical research of material investigations creating a new measurement capability in these and other scientific fields.

Figure shows an equivalent circuit model of the measuring circuit which includes the parasitic parameters usually called residual parameters. All data is then outputted in the following format: To obtain reliable measurement results, observe the following: Note ZERO offset adjustment can be performed at one specified test frequency.

Impedance of a comiponent can be expressed in vector representation by a complex number as shown in Figure Measure- ment accuracy of the A is specified under the following measurement conditions: It calls attention to a pro- cediire, practice, condition or the like, which, if not correctly performed or adhered to, could result in injury or death to personnel.


A LCR METER [Obsolete] | Keysight (formerly Agilent’s Electronic Measurement)

Inductance together with sub- ordinate dissipation factor Dquality factor Qequiv- alent series resistance ESR or conductance G. Manuall Curve for Cyclic Magnetization.

The wide range capability of the A enables a measurement range from that for small capacitances such as ceramic chip capacitors and semiconductor junction capacitors to that for high capacitances such as the measurement of electrolytic capa- citors to be covered. The A Option provides the fol- lowing test frequencies instead of 10 step standard test frequencies unit: Note Option internal dc bias should be used for capacitance measure- ments below O.

As shown in Figurein- ductance or capacitance values for parallel and series equivalents are nearly equal when the dissipation factor is less than 0.

Install connector board assembly Recall Reference Data 3 – The measuring range for dissipation factor is from 0. The A measures induct- ance 4725a. Because of the non-linear impedance characteristics of semiconductor devices, a semiconductor measurement is subject to exact establishment of the test conditions to make measured values meaningful.

General information is not specifications but is manial characteristics included as additional information for the operator. Option content is, if any option is installed, displayed as: HP B Descri ption Test Fixture direct attachment type for general measurement of both axial and radial lead components.

Actually, a measurement can be taken if a certain magnitude of impedance larger than that of the unknown sample is present between the grounding point of the sample and instrument ground.

General Information sheet 2 of 2. Figure provides instructions for line voltage and fuse selection.

Option Ranging operation has actuated unuseable range. Optimum range for the sample value is automatically se- lected. Performs cyclic operation of internal function tests and displays diagnostic code sets when any ab- normality is detected. General Component measurements sheet 3 of 3.


Quality factor together with inductance or capacitance meas- urement. Increase dc bias supply output voltage while monitoring readout on output current me- ter until desired bias current is obtained. External DC Bias Circuits sheet 1 of 4.

Place Cc5;0pF guard plate between comoonent leads of the samole and connect it to outer conductor of A-terminal pair as illustrated at left: These units cover the lower and higher frequency re- gions, respectively — and both reflect the new concepts.

Fig- ure graphically shows the relationships of parallel and series parameters for various dissipation factor values. Table lists gen- eral information. Inductance or Capacitance to- gether with resistance measure- ment. Reference numbers in the photos are keyed to the associated descriptions.

Technical Support

Four Terminal Pair Measurement Principle Bias voltage settling time is short. This setting status will again be enabled instead of standard initial control settings when the instrument is turned on.

If the ship- ping container or cushioning material is damaged, notify the carrier as well as the Hewlett-Packard office, and be sure manuall keep the shipping materials for carrier’s in- spection until the contents of the shipment have been checked for completeness and the instrument has been checked mechanically and electrically.

Measurement Accuracies sheet 7 of 9. There are two ways to ensure that the dc bias voltage across the device under test remains constant at the specified value. Multiplies values of accu- racy equation terms that include a by If such 4275z occurs even under proper test conditions, notify the nearest Hewlett-Packard office.